Product Code: JLA_7_1_47

Authors:
B. Besco´s
A. Gonza´lez Uren˜a
Unidad de La´seres y Haces Moleculares, Instituto Pluridisciplinar, Universidad Complutense de Madrid, Juan XXIII‐1°, 28040‐Madrid, Spain

This paper reports on the simultaneous detection of Mg, Mn, and Ti in Al samples using laser‐breakdown spectroscopy and optical multichannel analysis of photoablated microplasma. Two different experimental procedures were used depending on the emission intensity selected as reference. For those elements like Mg and Mn having emission lines close to some line of the matrix element, a direct method was used that consisted of taking the major component emission intensity as reference. On the other hand, for elements like Ti with no emission lines close to those of the matrix element, the background emission intensity was taken as reference. As a result, using these two procedures with calibrated samples, well characterized linear working curves were determined for these minor components over the 0.01–1% concentration range. In addition, optimum experimental conditions were found that allow the analysis to be carried out in a fast and non‐invasive manner. The potential application of the method to on‐line industrial analysis is also suggested.